✦ LIBER ✦
Dielectric breakdown in SiO2 via electric field induced attached hydrogen defects
✍ Scribed by Jamil Tahir-Kheli; M. Miyata; W.A. Goddard III
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 219 KB
- Volume
- 80
- Category
- Article
- ISSN
- 0167-9317
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