Diagnostics of semiconductor structures by means of an apertureless near-field terahertz microscope

✍ Scribed by V. N. Trukhin; A. O. Golubo; A. V. Lyutetsky; B. A. Matveyev; N. A. Pikhtin; L. L. Samoilov; I. D. Sapozhnikov; I. S. Tarasov; M. L. Fel’shtyn; D. P. Khor’kov

• Book ID: 113078646
• Publisher: Springer US
• Year: 2012
• Tongue: English
• Weight: 187 KB
• Volume: 54
• Category: Article
• ISSN: 0033-8443
• DOI: 10.1007/s11141-012-9316-x