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Diagnostics of degradation processes induced by pulsed electric signals at the aluminum-silicon interface

✍ Scribed by A. A. Skvortsov; A. M. Orlov; V. V. Rybin

Book ID: 111449364
Publisher: SP MAIK Nauka/Interperiodica
Year: 2006
Tongue: English
Weight: 188 KB
Volume: 32
Category: Article
ISSN: 1063-7850
DOI: 10.1134/s1063785006030199

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