๐”– Bobbio Scriptorium
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Diagnostic electron microscopy, Volume 2 Edited by Benjamin F. Trump and Raymond T. Jones, 401 pp, illus, John Wiley & Sons, Somerset, NY, 1979. $35.00

โœ Scribed by Don J. Lapenas


Book ID
102510543
Publisher
John Wiley and Sons
Year
1979
Tongue
English
Weight
106 KB
Volume
1
Category
Article
ISSN
0738-1085

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