✦ LIBER ✦
Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons
✍ Scribed by Yu, S.; Jervis, B.W.; Eckersall, K.R.; Bell, I.M.
- Book ID
- 119778222
- Publisher
- IEEE
- Year
- 1997
- Tongue
- English
- Weight
- 130 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0278-0070
No coin nor oath required. For personal study only.