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Device loading effects on nonresonant detection of terahertz radiation by silicon MOSFETs

✍ Scribed by Stillman, W.; Shur, M.S.; Veksler, D.; Rumyantsev, S.; Guarin, F.

Book ID: 120519278
Publisher: The Institution of Electrical Engineers
Year: 2007
Tongue: English
Weight: 100 KB
Volume: 43
Category: Article
ISSN: 0013-5194
DOI: 10.1049/el:20073475

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