Device implantation complications during fellowship training: It is always the fellow’s fault, or is it?

✍ Scribed by Okabe, Toshimasa; Frisch, Daniel R.

• Book ID: 123297467
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 71 KB
• Volume: 10
• Category: Article
• ISSN: 1547-5271
• DOI: 10.1016/j.hrthm.2013.09.053