๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Device for testing space-age electronic equipment

Publisher
Elsevier Science
Year
1958
Tongue
English
Weight
174 KB
Volume
266
Category
Article
ISSN
0016-0032

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Any time a structure experiences stress reversal, part of its life is used up. The two most common types of stress cycles that cause the most damage in electronic equipment are thermal/temperature cycling and vibration cycling. These two types of cycling can occur separately or they can be combined.