✦ LIBER ✦
Device degradation model for polysilicon-oxide-nitride-oxide-silicon (SONOS) based on anode hole fluence
✍ Scribed by Jeong-Hyong Yi; Sang-Don Lee; Jin-Hong Ahn; Hyungcheol Shin; Young-June Park; Hong Shick Min
- Book ID
- 108207483
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 551 KB
- Volume
- 80
- Category
- Article
- ISSN
- 0167-9317
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