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Device benchmark comparisons via kinetic, hydrodynamic, and high-hield models

✍ Scribed by Carlo Cercignani; Irene M. Gamba; Joseph W. Jerome; Chi-Wang Shu


Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
864 KB
Volume
181
Category
Article
ISSN
0045-7825

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✦ Synopsis


This paper describes benchmark comparisons for a GaAs n À n À n diode. A global kinetic model is simulated, and compared with various realizations of the hydrodynamic model, depending on mobility calibration. Finally, the channel region alone is simulated, with interior boundary conditions derived from the kinetic model, by use of the high-®eld (augmented drift-diusion) model.