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Device-associated infection rates, device use, length of stay, and mortality in intensive care units of 4 Chinese hospitals: International Nosocomial Control Consortium findings

✍ Scribed by Hu, Bijie; Tao, Lili; Rosenthal, Victor D.; Liu, Kun; Yun, Yang; Suo, Yao; Gao, Xiandong; Li, Ruisheng; Su, Danxia; Wang, Hungmei; Hao, Chunxia; Pan, Wei; Saunders, Catherine L.


Book ID
122378168
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
152 KB
Volume
41
Category
Article
ISSN
1527-3296

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