✦ LIBER ✦

Device and materials characterization in manufacturing

✍ Scribed by J. Sites; J. Rand; L. L. Kazmerski; J. E. Phillips

Publisher: John Wiley and Sons
Year: 1997
Tongue: English
Weight: 177 KB
Volume: 5
Category: Article
ISSN: 1062-7995
DOI: 10.1002/(sici)1099-159x(199709/10)5:5<371::aid-pip188>3.0.co;2-q

No coin nor oath required. For personal study only.

✦ Synopsis

Diagnostic measurements of thin-®lm materials and complete devices and solar modules are necessary to optimize both the processes and the resulting modules. Measurements provide the connection between processing and performance. In this workshop, the panel and audience examined both in situ and post-processing diagnostic measurements and how they can be utilized in a manufacturing environment to monitor processes and performance. The need for future measurement technology is increasingly for on-site, manufacturing-compatible, non-contact techniques giving rapid feedback in the production environment.

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