Device and Circuit Co-Design Robustness Studies in the Subthreshold Logic for Ultralow-Power Applications for 32 nm CMOS

✍ Scribed by Vaddi, R.; Dasgupta, S.; Agarwal, R.P.

• Book ID: 114619914
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 659 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2009.2039529