Development of total reflection x-ray fl
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Christina Streli
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Article
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2000
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John Wiley and Sons
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English
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Total reflection x-ray fluorescence analysis (TXRF) has been developed systematically at the Atominstitute from 1974 continuously up to the present. It is now an internationally accepted and applied method of trace element analysis by energy-dispersive XRF in a special excitation mode competing with