Developments likely to improve the reliability of plastic encapsulated devices : R. O. Jones. Microelectron. Reliab. 17, 273 (1978)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 115 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90350-5