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Development of thin-film plastic scintillator detectors for use in in-beam fission studies

✍ Scribed by P.D. Goldstone; R.E. Malmin; F. Hopkins; P. Paul

Publisher
Elsevier Science
Year
1974
Weight
504 KB
Volume
121
Category
Article
ISSN
0029-554X

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## Abstract The problem of structure investigation of thin films using laboratory XRD diffraction intensities was discussed as a matter of debate. Is the variation in relative intensities of the diffraction patterns due to crystallographic preferred orientation, lattice defects or both? The answer