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Development of the critical film thickness correlation for an advanced annular film mechanistic dryout model applicable to MARS code

✍ Scribed by Ji-Han Chun; Won-Jae Lee; Cheol Park; Un-Chul Lee


Book ID
108362692
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
393 KB
Volume
223
Category
Article
ISSN
0029-5493

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