Development of specimen holders for measuring electrical properties of oxides under electron irradiation in HVEM

✍ Scribed by K. Shiiyama; C. Kinoshita; H. Suzuki; T. Izu; M. Kutsuwada; S. Matsumura

• Book ID: 113286159
• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 364 KB
• Volume: 91
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/0168-583x(94)96232-4