Development of robust interconnect model based on design of experiments and multiobjective optimization

✍ Scribed by Qiang Zhang; Liou, J.J.; McMacken, J.; Thomson, J.; Layman, P.

• Book ID: 114538808
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 181 KB
• Volume: 48
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.944173