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Development of quality control system for flat-panel detectors

✍ Scribed by Atsushi Teramoto; Takahiko Kajihara; Shoichi Suzuki; Kazuo Kinoshita; Masatoshi Tsuzaka; Hiroshi Fujita


Book ID
107620589
Publisher
Springer Japan
Year
2011
Tongue
English
Weight
395 KB
Volume
4
Category
Article
ISSN
1865-0333

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To measure the origins and dependencies of image lag in indirect converting flat-panel detectors, different methods were implemented. According to ASTM E 2597-07, the detector will be irradiated for a defined period with a constant flux. Then shutting off the tube, one can determine the image lag by