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Development of methodology for assessment of shelf-life of fried potato wedges using electronic noses: Sensor screening by fuzzy logic analysis

✍ Scribed by Chatterjee, Dipan; Bhattacharjee, Paramita; Bhattacharyya, Nabarun


Book ID
121714388
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
879 KB
Volume
133
Category
Article
ISSN
0260-8774

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