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Development of CdTe hybrid detector with CMOS charge integration amplifier

✍ Scribed by K. Fujita; K. Matsue; M. Ichikawa; K. Yamamoto


Book ID
104068132
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
448 KB
Volume
636
Category
Article
ISSN
0168-9002

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✦ Synopsis


A pixelated CdTe detector module is being developed for use in X-ray imaging application. The CdTe is expected to allow higher energy detection capability because of the high atomic number. And also, high resolution imaging becomes possible with a direct conversion method in which an incident X-ray photon is directly converted to electric charges. This paper reports the first results of a 50 mm pitch, 64 Â 64 pixels, CdTe hybrid imaging module with CMOS charge integration readout ASIC with a flip chip bonding technique.