✦ LIBER ✦
Development of bubble memory chip test system : Yoshifusa Wada, Kousuke Takahashi and Seiichi Suga. NEC Res. & Develop. No. 41. p. 61. (April 1976)
- Book ID
- 103272874
- Publisher
- Elsevier Science
- Year
- 1976
- Tongue
- English
- Weight
- 128 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0026-2714
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