## BesancΓ on Classical atomic force microscopes use a soft cantilever spring to convert the interaction between a tip and a surface into a displacement. This leads to indirect force measurement and instability in the case of attractive forces. We have developed a new kind of force sensor to overc
β¦ LIBER β¦
Development of an X-band magnetic resonance force microscope
β Scribed by M. Toda; N. Ohno; T. Fujita; T. Kanemaki; S. Mitsudo; T. Idehara; Y. Fujii; M. Chiba; Y.J. Lee; J.T. Markert
- Book ID
- 108184517
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 106 KB
- Volume
- 310
- Category
- Article
- ISSN
- 0304-8853
No coin nor oath required. For personal study only.
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