✦ LIBER ✦
Development of an RF IV waveform based stress test procedure for use on GaN HFETs
✍ Scribed by William McGenn; Michael J. Uren; Johannes Benedikt; Paul J. Tasker
- Book ID
- 119326758
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 449 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0026-2714
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