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Development of a scanning minority carrier transient spectroscopy method: Application to the study of gold diffusion in a silicon bicrystal

✍ Scribed by T. Heiser; A. Mesli; P. Siffert


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
324 KB
Volume
4
Category
Article
ISSN
0921-5107

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✦ Synopsis


A scanning minori O' carrier transient spectroscopy (SMCTiS) method with optical injection attd full transient analysis is deveh)ped to obtain the lateral dis'tribution of e#ctrically active defects'.

Front an approl)riate theoretical model and a new signal treatment, the .spatial resolution in addition to the shape of the signal are controlled. Influences of non-exponential transients on the final defect distribution can then be determined. Finally the technique is applied to study the gold diffusion along the grain botmda O' in a silicon bicrystal and yields new resuhs on the nature of gold-related defects.