Development of a reliability strategy for new IC component family and process : Henry J. Kohoutek. Microelectron. Reliab.23 (2), 383 (1983)

• Book ID: 103276198
• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 101 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)90231-2