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Development of a QA phantom and automated analysis tool for geometric quality assurance of on-board MV and kV x-ray imaging systems

✍ Scribed by Mao, Weihua; Lee, Louis; Xing, Lei


Book ID
121293413
Publisher
American Institute of Physics
Year
2008
Tongue
English
Weight
677 KB
Volume
35
Category
Article
ISSN
0094-2405

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