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Development of a Process Analytical Technology (PAT) for in-line monitoring of film thickness and mass of coating materials during a pan coating operation

✍ Scribed by Claire Gendre; Muriel Genty; Mathieu Boiret; Marc Julien; Loïc Meunier; Olivier Lecoq; Michel Baron; Pierre Chaminade; Jean Manuel Péan


Book ID
113592464
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
750 KB
Volume
43
Category
Article
ISSN
0928-0987

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