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Development of a new automatic system for fault tree analysis for chemical process industries

โœ Scribed by Jiyong Kim; Jinkyung Kim; Younghee Lee; Il Moon

Book ID
107514317
Publisher
Springer US
Year
2009
Tongue
English
Weight
783 KB
Volume
26
Category
Article
ISSN
0256-1115

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## Abstract A methodology has been developed to conduct probabilistic fault tree analysis during risk assessment in chemical process industries. The methodology is based on a system involving (a) development of fault tree, (b) determination of minimum cutsets or shortest pathways leading from initi