Development of a microprocessor-based four probe DC resistivity setup for Tc measurement of superconducting materials

✍ Scribed by Pragasam, R.; Murthy, V.R.K.; Viswanathan, B.; Natarajan, T.S.

• Book ID: 114543750
• Publisher: IEEE
• Year: 1990
• Tongue: English
• Weight: 388 KB
• Volume: 39
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/19.58628