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Development of a high-precision surface metrology system using structured light projection

✍ Scribed by Ming-June Tsai; Chuan-Cheng Hung

Book ID: 104047345
Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 724 KB
Volume: 38
Category: Article
ISSN: 0263-2241
DOI: 10.1016/j.measurement.2005.07.014

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