Development of a FEM, FIM-AP system for studying gridded vacuum microelectronic devices

✍ Scribed by M. Huang; R.A.D. Mackenzie; G.D.W. Smith; N.A. Cade

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 734 KB
• Volume: 87-88
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(94)00484-6