Development and characterization of wheat-Leymus racemosustranslocation lines with resistance toFusariumHead Blight

✍ Scribed by Peidu Chen; Wenxuan Liu; Jianhua Yuan; Xiue Wang; Bo Zhou; Suling Wang; Shouzhong Zhang; Yigao Feng; Baojun Yang; Guangxin Liu; Dajun Liu; Lili Qi; Peng Zhang; Bernd Friebe; Bikram S Gill

• Book ID: 105813740
• Publisher: Springer
• Year: 2005
• Tongue: English
• Weight: 388 KB
• Volume: 111
• Category: Article
• ISSN: 0040-5752
• DOI: 10.1007/s00122-005-0026-z