Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing

✍ Scribed by Yang, M.-H.; Kim, Y.; Park, Y.; Lee, D.; Kang, S.

• Book ID: 117809976
• Publisher: The Institution of Engineering and Technology
• Year: 2007
• Tongue: English
• Weight: 147 KB
• Volume: 1
• Category: Article
• ISSN: 1751-8601
• DOI: 10.1049/iet-cdt:20060114