Determining weak Fermi-level pinning in MOS devices by conductance and capacitance analysis and application to GaAs MOS devices

✍ Scribed by K. Martens; W.F. Wang; A. Dimoulas; G. Borghs; M. Meuris; G. Groeseneken; H.E. Maes

• Book ID: 108271588
• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 282 KB
• Volume: 51
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/j.sse.2007.06.002