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Determining the refractive index and average thickness of AsSe semiconducting glass films from wavelength measurements only

✍ Scribed by Corrales, C. ;Ramírez-Malo, J. B. ;Fernández-Peña, J. ;Villares, P. ;Swanepoel, R. ;Márquez, E.

No coin nor oath required. For personal study only.

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