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Determining the depth of the fissured layer of the polished surface of quartz glass using the method of IR-ellipsometry

โœ Scribed by S. A. Alekseev; A. M. Kolosov; V. I. Pshenitsyn; I. A. Khramtsovskii


Publisher
Springer US
Year
1992
Tongue
English
Weight
374 KB
Volume
49
Category
Article
ISSN
0361-7610

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