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Determining surface recombination rates in epitaxial layers ofn-CdxHg1−xTe from measurements of the planar magnetoresistance and relaxation times for nonequilibrium charge carriers

✍ Scribed by P. A. Borodovskii; A. F. Buldygin; V. S. Varavin


Book ID
110119903
Publisher
Springer
Year
1998
Tongue
English
Weight
80 KB
Volume
32
Category
Article
ISSN
1063-7826

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