✦ LIBER ✦
Determining indices of refraction for ThO2 thin films sputtered under different bias voltages from 1.2 to 6.5 eV by spectroscopic ellipsometry
✍ Scribed by William R. Evans; David D. Allred
- Book ID
- 108289430
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 1006 KB
- Volume
- 515
- Category
- Article
- ISSN
- 0040-6090
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