For engineers and managers, explains how to use the measuring technique to enhance quality in manufacturing and assembly operations. Describes how to measure all types of industrial data, including attribute and non-normally distributed data; identify critical process characteristics and variables;
Determining and Assessing Process Capability for Engineers and Manufacturing
β Scribed by Fred Spiring
- Publisher
- Nova Science Publishers, Incorporated
- Year
- 2010
- Tongue
- English
- Leaves
- 189
- Series
- Quality Control Engineering and Manufacturing
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Synopsis
Process capability continues to receive a great deal of attention from practitioners and researchers alike. Since Sullivan introduced the concept to North America, the focus on process capability is due in part to the changing philosophy in Quality Assurance. Slogans such as βdoing things right the first time" and βbuilding a quality product" are terrific motivators, however if a process is not capable of meeting requirements, resources will be wasted. For example, if a mechanical process is not capable, the operators, regardless of their dedication and effort, will be unable to produce a quality product. Similarly if the operators are not capable of meeting the demands of the machinery, a quality product will not result. Processes that are not capable, regardless of their incapacity, waste resources. The goal of the book is to illustrate use of the most common process capability indices with the sincere hope that it will foster the safe use and development of PCIs among practitioners and researchers.
β¦ Subjects
Process control. ; Process control -- Statistical methods. ; Manufacturing processes.
π SIMILAR VOLUMES
Over 170 contributions (invited talks, oral presentations, and posters) were presented by participants from universities, research institutions, and industry, which offered interdisciplinary discussions indicating strong scientific and technological interest in the field of nanostructured systems. T