Determination of XUV optical constants by reflectometry using a high-repetition rate 46.9-nm laser

✍ Scribed by Artioukov, I.A.; Benware, B.R.; Rocca, J.J.; Forsythe, M.; Uspenskii, Yu.A.; Vinogradov, A.V.

• Book ID: 117866406
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 166 KB
• Volume: 5
• Category: Article
• ISSN: 1077-260X
• DOI: 10.1109/2944.814989