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Determination of trap depth and trap density in Se70Te30−xZnx thin films using thermally stimulated current measurements

✍ Scribed by S. Yadav; R.K. Pal; S.K. Sharma; A. Kumar


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
246 KB
Volume
404
Category
Article
ISSN
0921-4526

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