Determination of traces of As, B, Bi, Ga, Ge, P, Pb, Sb, Se, Si and Te in high-purity nickel using inductively coupled plasma-optical emission spectrometry (ICP-OES)

✍ Scribed by Thangavel, S.; Dash, K.; Dhavile, S.M.; Sahayam, A.C.

• Book ID: 126682679
• Publisher: Elsevier Science
• Year: 2015
• Tongue: English
• Weight: 938 KB
• Volume: 131
• Category: Article
• ISSN: 0039-9140
• DOI: 10.1016/j.talanta.2014.08.026