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Determination of Trace Amounts of Gaseous Elements (C and O) in High-Purity Iron

โœ Scribed by Takada, K. ;Morimoto, Y. ;Yoshioka, K. ;Murai, Y. ;Abiko, K.


Publisher
John Wiley and Sons
Year
1998
Tongue
English
Weight
189 KB
Volume
167
Category
Article
ISSN
0031-8965

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โœฆ Synopsis


In order to precisely determine trace amounts of carbon (below about 5 mg/g) and oxygen (below about 5 mg/g) in a high-purity iron, it is necessary to remove carbon and oxygen adsorbed and combined on the surface of the iron as contamination, and to lower the experimental blank value. When the surface of the iron was polished electrolytically in an ice-cooled mixture of perchloric acid and acetic acid or etched chemically in an ice-cooled mixture of hydrofluoric acid, hydrogen peroxide and distilled water, adsorbed and combined carbon on the surface was removed. Oxygen was almost removed by electrolysis in an ice-cooled mixture of acetic acid and perchloric acid or by coating with 1,10-phenanthroline following chemical etching in hydrochloric acid. By means of these polishing procedures, the precision of determination of carbon and oxygen was improved. The experimental background level of carbon was reduced by pre-heating of a porcelain crucible and an accelerator for combustion of the analytical sample in atmosphere, and similarly the level of oxygen was reduced by heating a graphite crucible in an analytical equipment at high temperature.


๐Ÿ“œ SIMILAR VOLUMES


Determination of Trace Amounts of Si and
โœ Hanada, K. ;Fujimoto, K. ;Shimura, M. ;Yoshioka, K. ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 134 KB

Analytical methods were investigated to improve the sensitivity of detecting trace amounts of Si and P in high-purity iron and steels. Silicon and P in the solutions were converted to SiMo 12 O 40 4ร€ and P 2 Mo 18 O 62 6ร€ , respectively, and adsorbed on a dextran gel column (Sephadex 1 G25 medium).