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Determination of the systematic measuring error of scattering parameters of shf transistors as six-terminal networks

✍ Scribed by A. I. Smirnov; A. A. Pavlyukovskii; V. I. Popov; N. I. Aleshkin; A. V. Gagarin


Publisher
Springer US
Year
1982
Tongue
English
Weight
366 KB
Volume
25
Category
Article
ISSN
0543-1972

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