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Determination of the structure of GeO2-SiO2 glasses by EXAFS and X-ray scattering

✍ Scribed by R.B. Greegor; F.W. Lytle; J. Kortright; A. Fischer-Colbrie

Book ID: 119443999
Publisher: Elsevier Science
Year: 1987
Tongue: English
Weight: 736 KB
Volume: 89
Category: Article
ISSN: 0022-3093
DOI: 10.1016/s0022-3093(87)80274-0

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