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Determination of the spatial variation of the carrier lifetime in a proton-irradiated Si n+-n-p+ diode by optical-beam-induced current measurements

✍ Scribed by Flohr, T.; Helbig, R.


Book ID
114536843
Publisher
IEEE
Year
1990
Tongue
English
Weight
334 KB
Volume
37
Category
Article
ISSN
0018-9383

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