Determination of Trace Elements in Micro
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S. Yamaguchi; T. Yokoyama; T. Nomizu; H. Kawaguchi
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Article
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1994
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Elsevier Science
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English
โ 345 KB
Trace elements in \(5-\mu\) l sample solutions deposited on a substrate were determined by secondary ion mass spectrometry employing the internal standard method. A simple sample mount made of copper was devised to restrict the sample residue within a small area. The absolute detection limits of 22