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Determination of the spatial distribution of trace elements in stainless steel by imaging microprobe secondary ion mass spectrometry

โœ Scribed by Ghaleb N. Salaita


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
1009 KB
Volume
90
Category
Article
ISSN
0169-4332

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Trace elements in \(5-\mu\) l sample solutions deposited on a substrate were determined by secondary ion mass spectrometry employing the internal standard method. A simple sample mount made of copper was devised to restrict the sample residue within a small area. The absolute detection limits of 22