Determination of the Se Atom Distribution in the Layered Compound Nb3(Se1–xIx)I7 by Scanning Tunneling Microscopy

✍ Scribed by Peter J. Schmidt; Gerhard Thiele; Myung-Hwan Whangbo

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 400 KB
• Volume: 1999
• Category: Article
• ISSN: 1434-1948
• DOI: 10.1002/(sici)1099-0682(199905)1999:5<785::aid-ejic785>3.0.co;2-e

✦ Synopsis

The layered compound Nb 3 (Se 1-x I x )I 7 is obtained when the I of the Se atoms in Nb 3 (Se 1-x I x )I 7 were examined by scanning tunneling microscopy. The analysis shows that the atoms at the face-capping sites of the layered compound Nb 3 I 8 are replaced by Se atoms. The amount and distribution distribution of the Se atoms is completely random.